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PDH/T-Carrier Jitter Module |
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DS1/E1/E3/DS3/E4 testing with optional jitter and wander
 DS1 • E1 • E3 • DS3 • E4 • Fractional DS1/E1 • Jitter • Wander Testing Jitter and wander testing is vital to detect flaws and inconsistencies in timing systems that would hamper the ability to transfer data at high rates. Jitter testing is used in the design of equipment, manufacturing test, field implementation and maintenance.
The NIC PDH/T-Carrier Testing Module with Jitter and Wander options provide Jitter generation and measurement for DS1 (1.5M), E1 (2M), E3 (34M), DS3 (45M) and E4 (139M) in accordance with O.171 and O.172.
The NIC PDH/T-Carrier Testing Module can be used to perform: - Intrinsic Jitter Measurement
- Jitter Transfer Testing
- Jitter Tolerance Testing
- Complete Wander Analysis
Product Datasheets |
